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NEW & Orignal KODAK KAF-10010CE、CX Image Sensor 3876 (H) x 2584 (V) Full-Frame CCD Color Image Sensor With Square Pixels for Color Cameras

KAF-10010-CE/CX
The KAF-10010CE is a 31.7mm diagonal (Type APS+) high performance color full-frame CCD (charge-coupled device) image sensor designed for a wide range of color image sensing applications including digital imaging. 10.3M Pixels,3876 (H) x 2584 (V),Each of t
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  • Description
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The KAF-10010CE /CX is a 31.7mm diagonal (Type APS+) high performance color full-frame CCD (charge-coupled device) image sensor designed for a wide range of color image sensing applications including digital imaging. Each pixel contains blooming protection by means of a lateral overflow drain thereby preventing image corruption during high light level conditions. Each of the 6.8μm square pixels are patterned with an RGB mosaic color filter with overlying micro lenses for improved color response and reproduction. A border of buffer and light-shielded pixels surrounds the photoactive pixels.
 
 
Parameter
 
Typical Value
Architecture Full Frame CCD; with Square Pixels
Total Number of Pixels 3991 (H) x 2679 (V) = 10.7M
Number of Effective Pixels 3916 (H) x 2624 (V) = 10.3M
Number of Active Pixels 3876 (H) x 2584 (V) = 10.0M
Pixel Size 6.8μm (H) x 6.8μm (V)
Imager Size 31.7mm (diagonal)
Chip Size 29.0mm (H) x 19.1mm (V)
Aspect Ratio 3:2
Saturation Signal 40K e-
Quantum Efficiency (RGB) 0.34, 0.40, 0.36
Total Sensor Noise 17 e-
Dark Signal 0.04 mV/s
Dark Current Doubling Temperature 5.8 dC
Linear Dynamic Range 67 dB
Charge Transfer Efficiency 0.999995
Blooming Protection @4ms integration time 1000x saturation exposure
Maximum Data Rate 28 MHz
 

 





























Dark Reference Pixels

Surrounding the periphery of the device is a border of light shielded pixels creating a dark region. Within this dark region, exist light shielded pixels that include 24 leading and trailing dark pixels on every line. There are also 27 full dark lines at the start and end of every frame. Under normal circumstances, these pixels do not respond to light and may be used as a dark reference.
 
Scavenging Pixels
Within the dark region some pixels are in close proximity to an active pixel, or the light sensitive regions that have been added for manufacturing test purposes, (CTE Monitor). In both cases, these pixels can scavenge signal depending on light intensity and wavelength. These pixels should not be used as a dark reference and are called scavenging pixels.

Dummy Pixels
Within the horizontal shift register there are 3 leading additional shift phases that are not electrically associated with any columns of pixels within the vertical register. These pixels contain only horizontal shift register dark current signal and do not respond to light and therefore, have been designated as dummy pixels. For this reason, they should not be used to determine a dark reference level.

Active Buffer Pixels
Twenty unshielded pixels adjacent to any leading or trailing dark reference regions are classified as active buffer pixels. These pixels are light sensitive but they are not tested for defects and non-uniformities.
 
CTE Monitor Pixels
Within the horizontal dummy pixel region two light sensitive test pixels (one each on the leading and trailing ends) are added and within the vertical dummy pixel region one light sensitive test pixel has been added. These CTE monitor pixels are used for manufacturing test purposes. In order to facilitate measuring the device CTE, the pixels in the CTE Monitor region are coated with blue pigment.
 
Image Acquisition
An electronic representation of an image is formed when incident photons falling on the sensor plane create electron-hole pairs within the device. These photon-induced electrons are collected locally by the formation of potential wells at each photogate or pixel site. The number of electrons collected is linearly dependent on light level and exposure time and non-linearly dependent on wavelength. When the pixel's capacity is reached, excess electrons are discharged into the lateral overflow drain to prevent crosstalk or blooming. During the integration period, the V1 and V2 register clocks are held at a constant (low) level.
 
Charge Transport
The integrated charge from each photogate is transported to the output using a two-step process. Each line (row) of charge is first transported from the vertical CCDs to a horizontal CCD register using the V1 and V2 register clocks. The horizontal CCD is presented a new line on the falling edge of V2 while H1 is held high. The horizontal CCDs then transport each line, pixel by pixel, to the output structure by alternately clocking the H1 and H2 pins in a complementary fashion. A separate connection to the last H1 phase (H1L) is provided to improve the transfer speed of charge to the floating diffusion. On each falling edge of H1 a new charge packet is dumped onto a floating diffusion and sensed by the output amplifier.


 
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